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正型光阻劑
  負型光阻劑
  顯影劑
  蝕刻液/剝離液
  平坦化阻劑
  熱固化玻璃樹脂
  低介電研磨液/銅研磨液
  乾膜光阻
  黑色矩陣
  3D列印紫外線活化樹脂
   
   
  光引發劑 光敏劑
   
   
   
   
   
   
   
   
   
   
   

   

   
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半導體製造技術的尖端化始於旋寶好化學的精密技術

半導體集成回路只是薄薄的小硅片,但其內部裝載數萬乃至數千萬個電路元件(三級管二級管電阻電容器)

這些電路元件準確被連接成為進行數據處理的邏輯回路和儲存數據的存儲器” . 在半導體基板上面細微複雜的圖案連接成這些元件 , 就像洗相片時使用的膠卷那樣 , 把這些圖案照相後縮小在膜上.這些在基板上精密連接電路元件形成的膜多張重疊形成半導體集成回路.旋寶好化學的光刻膠 ,顯像液,研磨劑,BARCTCM等就是在此工藝中使用的必需品.旋寶好化學為給顧客最大滿意,堅持不停止超精密技術產品的研究開發 

Photoresist (光刻膠)
光刻膠是照射特定波長的光後 , 利用物理
化學變化轉印特定圖案時使用的物質,是使用於半導體電路工藝中光刻工藝的核心技術
BARC (Bottom Anti-Reflective Coating)

是塗抹於光刻膠下面的反射塗層,能夠改善在半導體電路形成過程中因半導體基板反射曝光發生的Standing wavenotching等問題

TCM (Top Coating Material)
Immersion
是在透光鏡和PR之間注入折射率大於空氣的水,以增加焦點深度,提高步進曝光機分辨能力的技術,使用於50mm以下圖案的形成.TCM是塗抹在PR上部的材料,用來在Immersion工藝中防止PR被透光鏡和PR之間的水溶解
CMP Slurry (研磨劑
)

在半導體的高度集成化過程中 , 為在超小的面積上形成回路 ,重疊多層回路的同時縮小回路間間隔.但如果間隔太小,就很難克服各不同位置的高度差 ,重疊多層,所以形成一個層后通過化學,物理Polishing平整后再形成下一個層
Thinner
TFT-LCD及半導體製造過程中,能夠在短時間內有效清除玻璃及硅片邊緣和背面的多餘光刻膠,也能夠清除附著在裝備上的Particle

Stripper
TFT-LCD及半導體製造過程中,使用於清除多余光刻膠

Etchant (
蝕刻劑)

蝕刻劑是石印(Photolithography)工藝的核心材料,通過化學反應清除Thin film特定部位的物質.
Silicone materials for LED (LED用有機硅浸漬料)
LED封裝(Packaging)工藝的核心材料,用來提高光提取率,實現LED的高亮度,保護電路元件不受外部環境(水分或氧氣等)影響.是在EncapsulantLens molding工藝中用來實現熱穩定性,耐光性,高透明性的硅樹脂材料


XBH
is
Supplier of lithographic products including ultra-pure negative / positive photoresist and planarizing coating for the microelectronic, optoelectronic and graphic arts industries and other customer-specific specialty coatings


XBH provide a negative acting resist that is soluble in acetone and has an easy to use water soluble developer.  It's really a negative acting positive resist.  It is very easy to use.

 
Electro-Deposited Photoresist
Negative Photoresists
Positive Photoresists
Silylation Process
Edge Bead Removers
Lift-off resist
Resist Developers
Resist Removers
Planarizing Coatings
Spin-On Glass Coatings
Spin-On Dopants
Nanoimprint Lithography, NIL
Photosensitive Polyimides (PSPI)
Microfluidics PDMS
hexamethyldisilazane (HMDS)
Etch Rates For Micromachining Processing II (nm/min)

g=436 nm h=405 nm i=365 nm
  Photoresist Thickness
 µm
Wavelength Aspect Ratio Primary Uses
B series     193   contact holes, line/space
E and F series     248   multi-purpose, back end
JS 2184 Positive 0.6-1.2 i Ultra high line/space, contact holes
JS 812 Positive 0.6-3.0 i High line/space, contact holes
JS 814 Positive 0.8-1.4 i Mid-range line/space, contact holes
JS 1011 Positive 2-4.5 i High aspect ratio line/space
N7000 Negative 0.6-10 i   ion implant, high speed
MPG 3000 Negative 1.5-10 i   lift off
MPG 6000 Negative 0.75-1.5 i High lift off
4400 Positive 1-2.5 ghi   general purpose
4400-G Positive 0.8-5 ghi   general purpose, high speed
2600 Positive 0.4-4 ghi   general purpose, wet etch
5000 Negative 2.5-5.5 gh    
Q5000 series Positive 2-55 gh 2:1  
5600 series Positive 2-55 gh 2:1  
1030 series Positive 3-50 ghi 3:1  
20Y Positive 4-50 ghi 3:1 plating and etch applications
60Y Positive 15-65 gh 3:1 plating and etch applications
M-40   6-25 gh 2:1  
M-50   20-30 gh 2:1  
6 series Positive 3-5 ghi 2:1  
23 series Positive 5-20 ghi 4:1 Cu RDL and TSV applications
50 series Positive 20-100 ghi 4:1 etch and plating applications
235 series Negative 20-120 ghi 6:1  

Absorbance Modulation Optical Lithography

Instituto de Energia Solar1 – Universidad Politecnica de Madrid – Negative Resist Research – Summer 2003
A novel self-assembled and maskless technique for highly uniform arrays of nanon holes and nano-pillars

Etch Rates For Micromachining Processing



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